Honghong ADC/DAC Test System

High Performance Analog and Mixed Signal Test Solutions

 Honghong ADC/DAC Test System is a 9-slot ATE chip test platform with modular design to ensure flexibility and scalability, focusing on in-depth testing of digital-to-analog and analog-to-digital converter chips. The system includes a full range of ADC/DAC linear dynamic evaluation, equipped with a DIO clock synchronization module for 8-24 bit ADC/DAC testing, and a sampling rate of up to 400 MHz, reinventing a new standard for efficient wafer testing.

System Advantages

Macronix ADC/DAC test systems are ideal for accelerating product development, optimizing resource allocation, and providing PCB customization services for wafer test carriers.

  • All-in-one, flexible and efficient

Honghong ADC/DAC TestThe system utilizesHighly integrated designThe device is designed to simplify the installation and use of the equipment by concentrating multiple test functions into one unit.Easy wiringFeatures mean users can deploy quickly and without complex connectivity issues. Platform SupportModular CustomizationUsers can freely choose and combine test modules according to their specific needs, realizing personalized test solutions. More importantly, the system providesVarious parameters can be adjustedThis ensures that it can be accurately adapted to the specific testing needs of different users. By integrating multiple tests in oneOne system for multiple testing tasksThis effectively avoids the cost and hassle of purchasing additional test accessories and significantly reduces maintenance costs and overall operating expenses.  

ATX7006A 測試平台展示
測試設置對比：傳統與現代
  • Extreme testing to accelerate the R&D process

Users only1Weekly TimeThe design of the board to be tested can then be completed and plugged into the Honghong ADC/DAC test platform. If using traditional instruments and test methods, users need to spend more money to test the board.roughly3-4周The platform of Honghong directly provides complete test items, which greatly saves users' R&D and testing time.Efficiency gains10more than double！

Traditional Instruments and Methods

Poor test flexibility, need to prepare more materials and instruments, multiple instruments need to be controlled independently and then linked.

待測 ADC 設置流程圖

Honghong ADC/DAC Test System

Significantly simplify the design of test panels.
Provide complete test items

DAC 電路設計圖及實物
  • Out of the box, what you get is what you need
宏虹ADC/DAC測試系統
德思特ADC/DAC測試系統

Honghong ADC/DAC Test System

The ATEN ADC/DAC test system integrates a powerful management system to unify the deployment of hardware resources and test procedures, freeing users from cumbersome hardware and software compatibility issues.

  • The platform covers almost all common test projects.
  • Simple configuration by the user according to the actual needs
  • Automated testing process at the touch of a button

This design removes the inconvenience of having to manually build a software platform to adapt to multiple hardware devices in traditional tests, and significantly reduces operational difficulties and time costs.

測試結果

Precise calibration mechanism

Macronix ADC/DAC test systems have a built-in precision calibration mechanism to ensure that each test achieves extremely high accuracy and reliability, providing users with trustworthy test results.

  • Automatically analyze and process huge amounts of data through advanced analytics
  • Eliminates the need for users to write additional programs to complete data compensation, aggregation and computation.
  • Intelligent Data Processing Capabilities

This intelligent data processing capability enables real-time output of critical test conclusions, allowing users to quickly grasp the core indicators of product performance and providing more substantial data support for subsequent decision-making.

Supports rich test items

MAXTRON ADC/DAC test system is a comprehensive solution covering a wide range of test projects to meet high standards.

ADC Linearity Test

Out-of-phase error;Code Analysis
Gain error;Trigger
Full scale error
Non-linear Error of Integral Points
Differential non-linear error
Overall Tolerance

DAC Linearity Test

Out-of-tune error
Gain error
Full scale error
Non-linear Error of Integral Points
Differential non-linear error
Overall Tolerance

ADC Histogram Test

Non-linear Error of Integral Points
Differential non-linear error
Overall Tolerance
Trigger
Code Analysis

Dynamic Test

signal-to-noise-distortion ratio
Actual Effective Digits
signal-to-noise ratio
Total Harmonic Distortion
Noiseless dynamic range
peak distortion

Product Features and Parameters

Honghong ADC/DAC test system combines high performance, high accuracy and flexibility.

ADC/DAC Test System Product Features

The TS-ATX7006A is a fully integrated solution for testing ADCs, DACs and other analog functions. It combines very high accuracy, low noise and fast sampling with ease of use. Traditionally, DAC chips have been tested using a full suite of bench-top instruments, filters, switching matrices, and user-defined software. The ATX7006A is a single instrument for all DAC testing. This means you can focus on testing the converter with an ADC/DAC rather than fine-tuning test setups.

宏虹ADC-DAC測試系統
  • Integrated ADC/DAC Chip Test Platform
  • Customized Testing Solutions
  • AWG sampling rate up to 400 MHz
  • Unmatched signal quality and accuracy
  • Extensive test program support
  • Flexible, general-purpose digital IO modules
  • Self-contained analysis software with multiple views
  • Allow customized test scripts

ADC/DAC test system software ATView

The TS-ATX7006A comes with ATView, a software package for configuring, programming and controlling the TS-ATX7006A and analyzing test results.

  • check Project Engineering
  • check For Windows PC
  • check Test Analysis
  • check Displays the results of time domain, frequency domain, and histogram tests.

To set up a test simply fill in the fields on the dashboard, program a numeric mode if applicable, and press the TSTART button. After the test, the results are viewed in WaveAnalyzer, which displays results in the time domain, frequency domain, and histogram. Zoom, Stack and Cursor functions are available at any level. Save test results, including all settings. Test results and test conditions are stored in XML format, allowing further processing by the user. Export files can be in CSV format. Export files can be in CSV format and can also be images for easy import into reports.

ATView軟件截圖
ADC/DAC測試系統配套軟體ATView

Flexible and configurable internal modules

Click on the model number to see detailed product specifications

Digitalizer TS-WFD series is optional.

ModeldescriptiveDigitsSampling Rate
TS-WFD16Digitizer Module16-bit180 Msps
TS-WFD20Digitizer Module20th place2Msps
TS-WFD22Digitizer ModuleTwenty-two.1Msps

Arbitrary Waveform Generator TS-AWG Series Optional

ModeldescriptiveDigitsSampling Rate
TS-AWG16Arbitrary Waveform Generator Module16-bit400Msps
TS-AWG18Arbitrary Waveform Generator Module18th300Msps
TS-AWG20Arbitrary Waveform Generator Module20th place2Msps
TS-AWG22Arbitrary Waveform Generator ModuleTwenty-two.2Msps

Other Optional Modules

Modeldescriptivefunctionality
TS-DPS16Power ModuleSupports ±12 V-200 mA dual-channel reference signal output.
TS-DRS20Reference ModuleSupports ±10 V-10 mA dual-channel reference outputs
TS-DIO-IIDigital IO ModuleSupports 20/24 data bits; 8 pattern bits; Clock