ADC/DAC Test System
Functional overview
ADC/DAC測試系統是一套9槽ATE晶片測試平臺，模組化設計確保靈活性與擴展性，專注於數模及模數轉換晶片的深度測試。系統囊括ADC/DAC全範圍線性動態評估，搭載DIO時鐘同步模組，可測8-24 bit ADC/DAC，以高達400 MHz的採樣速率，重塑高效晶片測試新標準。
Description
System Advantages
ADC/DAC測試The system utilizesHighly integrated designThe device is designed to simplify the installation and use of the equipment by concentrating multiple test functions into one unit.Easy wiringFeatures mean users can deploy quickly and without complex connectivity issues. Platform SupportModular CustomizationUsers can freely choose and combine test modules according to their specific needs, realizing personalized test solutions. More importantly, the system providesVarious parameters can be adjustedThis ensures that it can be accurately adapted to the specific testing needs of different users. By integrating multiple tests in oneOne system for multiple testing tasksThis effectively avoids the cost and hassle of purchasing additional test accessories and significantly reduces maintenance costs and overall operating expenses.
