{"id":33552,"date":"2024-10-02T17:44:54","date_gmt":"2024-10-02T09:44:54","guid":{"rendered":"https:\/\/hongtronics.com\/?page_id=33552"},"modified":"2024-10-08T18:01:27","modified_gmt":"2024-10-08T10:01:27","slug":"semiconductor-test-solutions-com","status":"publish","type":"page","link":"https:\/\/hongtronics.com\/en\/semiconductor-test-solutions-com\/","title":{"rendered":"\u534a\u5c0e\u9ad4\u6e2c\u8a66\u89e3\u6c7a\u65b9\u6848 – \u9ad8\u5bc6\u5ea6LXI\u8207PXI\u5207\u63db\u77e9\u9663\u6a21\u7d44"},"content":{"rendered":"
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\n\t\t\t\t\t\tHonghong Solutions\n\t\t\t\t\t<\/span>

Semiconductor Test<\/h2>\t\t\t\t
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Changing design scales, shrinking geometries, and the use of new materials make wafer-level reliability testing more important than ever for integrated circuit manufacturers.
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Acer provides modular PXI and LXI matrix switching solutions that have been used in many semiconductor test applications, including package-level and wafer-level testing, short\/open circuit, capacitance, I\/V testing for transient charge trapping and SCPT (Single Charge Pulse Trapping) ...<\/p>\n\t\t\t\t<\/div>\n\t\t\t<\/div><\/div>\t\t\t\t<\/div>\n\t\t\t\t<\/div>\n\t\t\t\t\t<\/div>\n\t\t<\/div>\n\t\t\t\t

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\n\t\t\t\t\t\n\t\t\t\t\t\t\n\t\t\t\t\t\t\t\t\t\ud83d\udd13 Open Box System Solution<\/span>\n\t\t\t\t\t<\/span>\n\t\t\t\t\t<\/a>\n\t\t\t\t<\/div>\n\t\t\t\t\t\t\t\t<\/div>\n\t\t\t\t<\/div>\n\t\t\t\t\t<\/div>\n\t\t<\/div>\n\t\t\t\t
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If a wafer is defective or packaging equipment fails, this will drive reliability testing and modeling upstream in the production process to reduce time, productivity, money and material loss...\n<\/p>\n <\/div>\n \n \n <\/div>\n <\/a>\n <\/div>\t\t\t\t<\/div>\n\t\t\t\t<\/div>\n\t\t\t\t\t<\/div>\n\t\t<\/div>\n\t\t\t\t

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Some background on open and short circuit testing, also known as structural testing, and Pickering's LXI Matrix Module as the best choice for Amkor applications...<\/p>\n <\/div>\n \n \n <\/div>\n <\/a>\n <\/div>\t\t\t\t<\/div>\n\t\t\t\t<\/div>\n\t\t\t\t\t<\/div>\n\t\t<\/div>\n\t\t\t\t

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High Density LXI Reed Relay Matrix Series, High Density LXI Reed Relay Matrix Series, BRIC\u2122 Ultra High Density PXI Matrix Module...\n\n\n<\/p>\n <\/div>\n \n \n <\/div>\n <\/a>\n <\/div>\t\t\t\t<\/div>\n\t\t\t\t<\/div>\n\t\t\t\t\t<\/div>\n\t\t<\/div>\n\t\t\t\t\t<\/div>\n\t\t<\/section>\n\t\t\t\t\t<\/div>\n\t\t<\/div>\n\t\t\t\t\t<\/div>\n\t\t<\/section>\n\t\t\t\t

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Open Box System Solution<\/h2><\/div><\/div>\t\t\t\t<\/div>\n\t\t\t\t<\/div>\n\t\t\t\t
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Changing design scales, shrinking geometries, and the use of new materials make wafer-level reliability testing more important than ever for integrated circuit manufacturers. If a wafer is defective or packaging equipment fails, this drives reliability testing and modeling upstream in the production process to reduce time, capacity, money and material losses.<\/p>


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\u00a0When faced with the problem of testing higher I\/O volumes while reducing costs, many reliability engineers find they cannot solve this problem with traditional switching solutions. Instead, engineers increasingly prefer modular, flexible solutions that can be scaled to fit their needs.<\/p>

Pickering's modular PXI and LXI matrix switching solutions have been used in many semiconductor test applications, including package-level and wafer-level testing, open\/short testing, capacitance testing, and I\/V testing for transient charge capture and SCPT single charge pulse capture.<\/p>\t\t\t\t\t\t\t\t<\/div>\n\t\t\t\t<\/div>\n\t\t\t\t

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Our semiconductor test matrix switching solutions have the following features: <\/p>\n

\u00b7       <\/span><\/span>High Fidelity Connectivity<\/span><\/b> - Pickering<\/span> <\/span><\/span><\/span>Primary reed relay<\/span><\/span><\/span>Low path resistance, reconnectable<\/span><\/span><\/span><\/p>\n

\u00b7       <\/span><\/span>Multiple analog buses<\/span><\/b> <\/span>-Can be tested in parallel to increase throughput<\/span><\/p>\n

\u00b7       <\/span><\/span>High relay closure counts<\/span><\/b> <\/span>-Used in I\/V <\/span>Multiple test points grounded during testing<\/span><\/p>\n

\u00b7       <\/span><\/span>Load the test sequence into the–<\/span><\/span><\/b> <\/span>Reduce test time by integrating into the unit and utilizing triggers to increase the ability to perform conversion tests.<\/span><\/p>\n

\u00b7       <\/span><\/span>Quick switching time–<\/span><\/span><\/b> <\/span>The matrix module is based on  pickering <\/span>Reed Relay<\/span><\/span> <\/span><\/span><\/p>\n

\u00b7       <\/span><\/span>Easily create switching paths<\/span><\/b>–<\/span>utilization Switch Path Manager <\/span>Signal Routing Software<\/span><\/span><\/span><\/span><\/p>\n

\u00b7       <\/span><\/span>Modular Design–<\/span><\/span><\/b>Scalable and easy system maintenance<\/span><\/p>\t\t\t\t\t\t\t\t<\/div>\n\t\t\t\t<\/div>\n\t\t\t\t\t<\/div>\n\t\t<\/div>\n\t\t\t\t\t<\/div>\n\t\t<\/section>\n\t\t\t\t

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Typical Case Sharing<\/h2><\/div><\/div>\t\t\t\t<\/div>\n\t\t\t\t<\/div>\n\t\t\t\t\t<\/div>\n\t\t<\/div>\n\t\t\t\t
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Clients<\/h2>\t\t\t\t
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Amkor Technology is one of the world's largest contract semiconductor assembly and test service providers. Founded in 1968, Amkor pioneered the outsourcing of IC packaging and test and is now a strategic manufacturing partner to more than 300 leading semiconductor companies and the electronics OEM world.<\/p>\n\t\t\t\t<\/div>\n\t\t\t<\/div><\/div>\t\t\t\t<\/div>\n\t\t\t\t<\/div>\n\t\t\t\t\t<\/div>\n\t\t<\/div>\n\t\t\t\t

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Applications<\/h2>\t\t\t\t
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Amkor's Korea division needed a new test system - one part of the system was to be used for open and short circuit testing of semiconductor packages. The project required a very large - 3072 x 4 matrix switch configuration to perform 4-wire measurements, I\/V characterization, and 2-wire measurements. Because it will be used in many test applications, it needs to be very cost-effective.\u00a0<\/p>\n\t\t\t\t<\/div>\n\t\t\t<\/div><\/div>\t\t\t\t<\/div>\n\t\t\t\t<\/div>\n\t\t\t\t

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>>>Open Short Circuit Test<\/h2><\/a><\/div><\/div>\t\t\t\t<\/div>\n\t\t\t\t<\/div>\n\t\t\t\t\t<\/div>\n\t\t<\/div>\n\t\t\t\t
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Solutions<\/h2>\t\t\t\t
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After recognizing their needs, Amkor decided to use three Pickering's LXI interface high density matrix modules (Model 60-553-008). These LXI matrix modules, which consist of electromagnetic relays, are available on the market at a lower price and allow up to 1027 intersections to be closed simultaneously.
In addition, from the point of view of testing relationship and future maintenance, this LXI matrix module is equipped with BIRST (Built-In Relay Self-Test) function, which allows users to check the status of each relay in the module at any time, thus making the system maintenance more convenient and faster.<\/p>\n\t\t\t\t<\/div>\n\t\t\t<\/div><\/div>\t\t\t\t<\/div>\n\t\t\t\t<\/div>\n\t\t\t\t\t<\/div>\n\t\t<\/div>\n\t\t\t\t\t<\/div>\n\t\t<\/section>\n\t\t\t\t

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Open Short Circuit Test<\/h2>\t\t\t\t
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Open and short circuit testing is the most commonly used method for evaluation and functional test verification of semiconductor packages. In addition to testing, it also enables package failure analysis in I\/V characterization tests.<\/p>\n\t\t\t\t<\/div>\n\t\t\t<\/div><\/div>\t\t\t\t<\/div>\n\t\t\t\t<\/div>\n\t\t\t\t

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For this type of application, test cells and matrix switches are essential, depending on the number of pins in the test cell, and the entire platform can be based on PXI or other LXI-like test platforms.<\/span><\/p>

For switching matrices, we use matrices that support both 2-wire (NX2) and 4-wire (NX4) measurements, depending on the customer's needs. For open and short circuit testing only, the NX2 configuration can be used. For low resistance measurements and high precision I\/v needs, eliminating switch and cable channel resistance, the NX4 must be chosen.<\/p>

Each of the three relay types has its own advantages and disadvantages for the 4-wire connection method:<\/p>\t\t\t\t\t\t\t\t<\/div>\n\t\t\t\t<\/div>\n\t\t\t\t\t<\/div>\n\t\t<\/div>\n\t\t\t\t\t<\/div>\n\t\t<\/section>\n\t\t\t\t

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Reed Relay<\/h2>\t\t\t\t<\/div>\n\t\t\t\t<\/div>\n\t\t\t\t\t<\/div>\n\t\t<\/div>\n\t\t\t\t
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Electromagnetic Relay<\/h2>\t\t\t\t<\/div>\n\t\t\t\t<\/div>\n\t\t\t\t\t<\/div>\n\t\t<\/div>\n\t\t\t\t
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\u00a0<\/p>